Findings from University of Namur Provides New Data about Machine Learning (When Magnetron Sputtering Deposition Meets Machine Learning: Application To Process Anomaly Detection)

Couverture médiatique

• titre	Findings from University of Namur Provides New Data about Machine Learning (When Magnetron Sputtering Deposition Meets Machine Learning: Application To Process Anomaly Detection)
  Media name / outlet	Electronics Daily
  Pays/Territoire	États-Unis
  la date	19/02/24
  Personnes	Stephane Lucas, Benoît Frénay, Emile Haye