Findings from University of Namur Provides New Data about Machine Learning (When Magnetron Sputtering Deposition Meets Machine Learning: Application To Process Anomaly Detection)

Press/Media: Expert Comment

Period	19 Feb 2024

Media coverage

Title	Findings from University of Namur Provides New Data about Machine Learning (When Magnetron Sputtering Deposition Meets Machine Learning: Application To Process Anomaly Detection)
Media name/outlet	Electronics Daily
Country/Territory	United States
Date	19/02/24
Persons	Stephane Lucas, Benoît Frénay, Emile Haye