Influence of silicon dangling bonds on germanium thermal diffusion within SiO2 glass

David Barba, R.S. Cai, Julien Demarche, Y.Q. Wang, Guy Terwagne, F. Rosei, François Martin, Guy G. Ross

    Research output: Contribution to journalArticlepeer-review

    Original languageEnglish
    JournalApplied Physics Letters
    Volume104
    Issue number111901
    Publication statusAccepted/In press - 17 Mar 2014

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