MUPPAAL: Reducing and Removing Equivalent and Duplicate Mutants in UPPAAL

Jaime CUARTAS GRANADA, Jesus Alexander ARANDA BUENO, Maxime Cordy, James Jerson Ortiz Vega, Gilles Perrouin, Pierre-Yves Schobbens

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Résumé

Mutation Testing (MT) is a test quality assessment technique that creates mutants by injecting artificial faults into the system and evaluating the ability of tests to distinguish these mutants. We focus on MT for safety-critical Timed Automata (TA). MT is prone to equivalent and duplicate mutants, the former having the same behaviour as the original system and the latter other mutants. Such mutants bring no value and induce useless test case executions. We propose MUPPAAL, a tool that: (1) offers a new operator reducing the occurrence of mutant duplicates; (2) an efficient bisimulation algorithm removing remaining duplicates; (3) leverages existing equivalence-avoiding mutation operators. Our experiments on four UPPAAL case studies indicate that duplicates represent up to 32% of all mutants and that the MUPPAAL bisimulation algorithm can identify them more than 99% of the time.
langue originaleAnglais
titreProceedings - 2023 IEEE 16th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2023
EditeurInstitute of Electrical and Electronics Engineers Inc.
Pages52-61
Nombre de pages10
ISBN (Electronique)9798350333350
Les DOIs
Etat de la publicationPublié - 16 avr. 2023
Evénement16th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2023 - Dublin, Irlande
Durée: 16 avr. 202320 avr. 2023

Série de publications

Nom2023 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)

Une conférence

Une conférence16th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2023
Pays/TerritoireIrlande
La villeDublin
période16/04/2320/04/23

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