MUPPAAL: Reducing and Removing Equivalent and Duplicate Mutants in UPPAAL

Jaime CUARTAS GRANADA, Jesus Alexander ARANDA BUENO, Maxime Cordy, James Jerson Ortiz Vega, Gilles Perrouin, Pierre-Yves Schobbens

Research output: Contribution in Book/Catalog/Report/Conference proceedingConference contribution

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Abstract

Mutation Testing (MT) is a test quality assessment technique that creates mutants by injecting artificial faults into the system and evaluating the ability of tests to distinguish these mutants. We focus on MT for safety-critical Timed Automata (TA). MT is prone to equivalent and duplicate mutants, the former having the same behaviour as the original system and the latter other mutants. Such mutants bring no value and induce useless test case executions. We propose MUPPAAL, a tool that: (1) offers a new operator reducing the occurrence of mutant duplicates; (2) an efficient bisimulation algorithm removing remaining duplicates; (3) leverages existing equivalence-avoiding mutation operators. Our experiments on four UPPAAL case studies indicate that duplicates represent up to 32% of all mutants and that the MUPPAAL bisimulation algorithm can identify them more than 99% of the time.
Original languageEnglish
Title of host publicationProceedings - 2023 IEEE 16th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages52-61
Number of pages10
ISBN (Electronic)9798350333350
DOIs
Publication statusPublished - 16 Apr 2023
Event16th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2023 - Dublin, Ireland
Duration: 16 Apr 202320 Apr 2023

Publication series

Name2023 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)

Conference

Conference16th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2023
Country/TerritoryIreland
CityDublin
Period16/04/2320/04/23

Keywords

  • Model-Based Testing
  • Mutation Testing
  • Timed Automata
  • UPPAAL

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