Vibrational study of the SiO2/Si interface by high resolution electron energy loss spectroscopy

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langue originale	Anglais
Pages (de - à)	1118-1121
Nombre de pages	4
journal	Journal of vacuum science and technology B
Volume	3
Etat de la publication	Publié - 1985

Contient cette citation

@article{645b1a12d103441e8da4eae53c3bb798,

title = "Vibrational study of the SiO2/Si interface by high resolution electron energy loss spectroscopy",

author = "Paul Thiry and Michael Liehr and Jean-Jacques Pireaux and Robert Sporken and Roland Caudano and Jean-Pol Vigneron and Amand Lucas",

year = "1985",

language = "English",

volume = "3",

pages = "1118--1121",

journal = "Journal of vacuum science and technology B",

publisher = "AVS Science and Technology Society",

}

TY - JOUR

T1 - Vibrational study of the SiO2/Si interface by high resolution electron energy loss spectroscopy

AU - Thiry, Paul

AU - Liehr, Michael

AU - Pireaux, Jean-Jacques

AU - Sporken, Robert

AU - Caudano, Roland

AU - Vigneron, Jean-Pol

AU - Lucas, Amand

PY - 1985

Y1 - 1985

M3 - Article

VL - 3

SP - 1118

EP - 1121

JO - Journal of vacuum science and technology B

JF - Journal of vacuum science and technology B

ER -