Original language | English |
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Pages (from-to) | 1118-1121 |
Number of pages | 4 |
Journal | Journal of vacuum science and technology B |
Volume | 3 |
Publication status | Published - 1985 |
Vibrational study of the SiO2/Si interface by high resolution electron energy loss spectroscopy
Paul Thiry, Michael Liehr, Jean-Jacques Pireaux, Robert Sporken, Roland Caudano, Jean-Pol Vigneron, Amand Lucas
Research output: Contribution to journal › Article