The alignment of spectrometers and quantitative measurements in X-ray photoelectron spectroscopy

Martin Seah, Steve Spencer, Frédéric Bodino, Jean-Jacques Pireaux

Résultats de recherche: Contribution à un journal/une revue › Article

langue originale	Anglais
Pages (de - à)	159-167
Nombre de pages	9
journal	Journal of Electron Spectroscopy and Related Phenomena
Numéro de publication	87
Etat de la publication	Publié - 1997

Contient cette citation

@article{a33208f0033f47e1818f12338010d170,

title = "The alignment of spectrometers and quantitative measurements in X-ray photoelectron spectroscopy",

author = "Martin Seah and Steve Spencer and Fr{\'e}d{\'e}ric Bodino and Jean-Jacques Pireaux",

note = "Publication code : **RES. ACAD.",

year = "1997",

language = "English",

pages = "159--167",

journal = "Journal of Electron Spectroscopy and Related Phenomena",

publisher = "Elsevier",

number = "87",

}

TY - JOUR

T1 - The alignment of spectrometers and quantitative measurements in X-ray photoelectron spectroscopy

AU - Seah, Martin

AU - Spencer, Steve

AU - Bodino, Frédéric

AU - Pireaux, Jean-Jacques

N1 - Publication code : **RES. ACAD.

PY - 1997

Y1 - 1997

M3 - Article

SP - 159

EP - 167

JO - Journal of Electron Spectroscopy and Related Phenomena

JF - Journal of Electron Spectroscopy and Related Phenomena

IS - 87

ER -