The alignment of spectrometers and quantitative measurements in X-ray photoelectron spectroscopy

Martin Seah, Steve Spencer, Frédéric Bodino, Jean-Jacques Pireaux

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)159-167
Number of pages9
JournalJournal of Electron Spectroscopy and Related Phenomena
Issue number87
Publication statusPublished - 1997

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