Molecular depth profiling of polymers with very low energy ions

Résultats de recherche: Contribution à un journal/une revueArticle

Résumé

The need for a molecular depth profiling technique to study organic layers has become a strong incentive in the SIMS community in the last few years, especially with the recent successes obtained with cluster ion beam depth profiling. In this work, we have investigated a thoroughly different approach by using very low energy (down to 200 eV) monoatomic or diatomic ions to sputter organic matter. Quite surprisingly, we were able to retain specific molecular information on various polymers even at very high fluence. Polymethylmethacrylate (PMMA) and polyethylene terephthalate (PET) films were depth-profiled with 200 eV Cs and 500 eV O ions. With 200 eV Cs ions, the best profiles were obtained in the negative mode, due to a strong negative ionisation yield enhancement related to Cs retention in the polymer. A relatively high and stable signal from the most characteristic ions was measured all over the layer. With 500 eV O, real molecular depth-profiles were also obtained in both the positive and the negative modes. Once again, the main characteristic fragments of PET or PMMA remain detectable with stable yields all over the profile.
langue originaleAnglais
Pages (de - à)970-972
Nombre de pages3
journalApplied Surface Science
Volume255
Numéro de publication4
Les DOIs
étatPublié - 15 déc. 2008

Empreinte digitale

Depth profiling
Polymers
Ions
Polyethylene Terephthalates
Polymethyl Methacrylate
Polyethylene terephthalates
Secondary ion mass spectrometry
Biological materials
Ion beams
Ionization

Citer ceci

@article{2e988592154144eab5ed6ed7786e1a60,
title = "Molecular depth profiling of polymers with very low energy ions",
abstract = "The need for a molecular depth profiling technique to study organic layers has become a strong incentive in the SIMS community in the last few years, especially with the recent successes obtained with cluster ion beam depth profiling. In this work, we have investigated a thoroughly different approach by using very low energy (down to 200 eV) monoatomic or diatomic ions to sputter organic matter. Quite surprisingly, we were able to retain specific molecular information on various polymers even at very high fluence. Polymethylmethacrylate (PMMA) and polyethylene terephthalate (PET) films were depth-profiled with 200 eV Cs and 500 eV O ions. With 200 eV Cs ions, the best profiles were obtained in the negative mode, due to a strong negative ionisation yield enhancement related to Cs retention in the polymer. A relatively high and stable signal from the most characteristic ions was measured all over the layer. With 500 eV O, real molecular depth-profiles were also obtained in both the positive and the negative modes. Once again, the main characteristic fragments of PET or PMMA remain detectable with stable yields all over the profile.",
author = "L. Houssiau and B. Douhard and N. Mine",
year = "2008",
month = "12",
day = "15",
doi = "10.1016/j.apsusc.2008.05.027",
language = "English",
volume = "255",
pages = "970--972",
journal = "Appl. Surface Science",
issn = "0169-4332",
publisher = "Elsevier",
number = "4",

}

Molecular depth profiling of polymers with very low energy ions. / Houssiau, L.; Douhard, B.; Mine, N.

Dans: Applied Surface Science, Vol 255, Numéro 4, 15.12.2008, p. 970-972.

Résultats de recherche: Contribution à un journal/une revueArticle

TY - JOUR

T1 - Molecular depth profiling of polymers with very low energy ions

AU - Houssiau, L.

AU - Douhard, B.

AU - Mine, N.

PY - 2008/12/15

Y1 - 2008/12/15

N2 - The need for a molecular depth profiling technique to study organic layers has become a strong incentive in the SIMS community in the last few years, especially with the recent successes obtained with cluster ion beam depth profiling. In this work, we have investigated a thoroughly different approach by using very low energy (down to 200 eV) monoatomic or diatomic ions to sputter organic matter. Quite surprisingly, we were able to retain specific molecular information on various polymers even at very high fluence. Polymethylmethacrylate (PMMA) and polyethylene terephthalate (PET) films were depth-profiled with 200 eV Cs and 500 eV O ions. With 200 eV Cs ions, the best profiles were obtained in the negative mode, due to a strong negative ionisation yield enhancement related to Cs retention in the polymer. A relatively high and stable signal from the most characteristic ions was measured all over the layer. With 500 eV O, real molecular depth-profiles were also obtained in both the positive and the negative modes. Once again, the main characteristic fragments of PET or PMMA remain detectable with stable yields all over the profile.

AB - The need for a molecular depth profiling technique to study organic layers has become a strong incentive in the SIMS community in the last few years, especially with the recent successes obtained with cluster ion beam depth profiling. In this work, we have investigated a thoroughly different approach by using very low energy (down to 200 eV) monoatomic or diatomic ions to sputter organic matter. Quite surprisingly, we were able to retain specific molecular information on various polymers even at very high fluence. Polymethylmethacrylate (PMMA) and polyethylene terephthalate (PET) films were depth-profiled with 200 eV Cs and 500 eV O ions. With 200 eV Cs ions, the best profiles were obtained in the negative mode, due to a strong negative ionisation yield enhancement related to Cs retention in the polymer. A relatively high and stable signal from the most characteristic ions was measured all over the layer. With 500 eV O, real molecular depth-profiles were also obtained in both the positive and the negative modes. Once again, the main characteristic fragments of PET or PMMA remain detectable with stable yields all over the profile.

UR - http://www.scopus.com/inward/record.url?scp=56449124172&partnerID=8YFLogxK

U2 - 10.1016/j.apsusc.2008.05.027

DO - 10.1016/j.apsusc.2008.05.027

M3 - Article

AN - SCOPUS:56449124172

VL - 255

SP - 970

EP - 972

JO - Appl. Surface Science

JF - Appl. Surface Science

SN - 0169-4332

IS - 4

ER -