Fourier transform analysis of STM images of multilayer graphene moiré patterns

Frédéric Joucken; Fernande Frising; Robert Sporken

doi:10.1016/j.carbon.2014.11.030

Fourier transform analysis of STM images of multilayer graphene moiré patterns

Frédéric Joucken, Fernande Frising, Robert Sporken

Résultats de recherche: Contribution à un journal/une revue › Article › Revue par des pairs

Résumé

With the help of a simple model, we analyze Scanning Tunneling Microscopy images of simple and double moiré patterns resulting from misoriented bi- and tri-layers graphene stacks. It is found that the model reproduces surprisingly well non-trivial features observed in the Fast Fourier Transform of the images. We point out difficulties due to those features in interpreting the patterns seen on the FFT.

langue originale	Anglais
Pages (de - à)	48-52
Nombre de pages	5
journal	Carbon
Volume	83
Date de mise en ligne précoce	20 nov. 2014
Les DOIs	https://doi.org/10.1016/j.carbon.2014.11.030
Etat de la publication	Publié - 1 mars 2015

Accès au document

10.1016/j.carbon.2014.11.030

http://www.sciencedirect.com/science/article/pii/S0008622314011026#

Microscopie à effet tunnel
Robert Sporken (!!Manager)
Plateforme technologique Morphologie, imagerie
Equipement/installations: Equipement
Synthèse, Irradiation et Analyse de Matériaux (SIAM) (2016 - ...)
Pierre Louette (!!Manager), Julien Colaux (!!Manager), Alexandre Felten (!!Manager), Tijani Tabarrant (!!Operator), Frederic COME (!!Operator) & Paul-Louis Debarsy (!!Manager)
Plateforme technologique Synthese, irradiation et analyse des materiaux
Equipement/installations: Plateforme technolgique

Contient cette citation

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title = "Fourier transform analysis of STM images of multilayer graphene moir{\'e} patterns",

abstract = "With the help of a simple model, we analyze Scanning Tunneling Microscopy images of simple and double moir{\'e} patterns resulting from misoriented bi- and tri-layers graphene stacks. It is found that the model reproduces surprisingly well non-trivial features observed in the Fast Fourier Transform of the images. We point out difficulties due to those features in interpreting the patterns seen on the FFT.",

author = "Fr{\'e}d{\'e}ric Joucken and Fernande Frising and Robert Sporken",

year = "2015",

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doi = "10.1016/j.carbon.2014.11.030",

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T1 - Fourier transform analysis of STM images of multilayer graphene moiré patterns

AU - Joucken, Frédéric

AU - Frising, Fernande

AU - Sporken, Robert

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Y1 - 2015/3/1

N2 - With the help of a simple model, we analyze Scanning Tunneling Microscopy images of simple and double moiré patterns resulting from misoriented bi- and tri-layers graphene stacks. It is found that the model reproduces surprisingly well non-trivial features observed in the Fast Fourier Transform of the images. We point out difficulties due to those features in interpreting the patterns seen on the FFT.

AB - With the help of a simple model, we analyze Scanning Tunneling Microscopy images of simple and double moiré patterns resulting from misoriented bi- and tri-layers graphene stacks. It is found that the model reproduces surprisingly well non-trivial features observed in the Fast Fourier Transform of the images. We point out difficulties due to those features in interpreting the patterns seen on the FFT.

U2 - 10.1016/j.carbon.2014.11.030

DO - 10.1016/j.carbon.2014.11.030

M3 - Article

AN - SCOPUS:84916911970

SN - 0008-6223

VL - 83

SP - 48

EP - 52

JO - Carbon

JF - Carbon

ER -

Fourier transform analysis of STM images of multilayer graphene moiré patterns

Résumé

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Empreinte digitale

Équipement

Microscopie à effet tunnel

Synthèse, Irradiation et Analyse de Matériaux (SIAM) (2016 - ...)

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