Fourier transform analysis of STM images of multilayer graphene moiré patterns

Frédéric Joucken, Fernande Frising, Robert Sporken

    Research output: Contribution to journalArticlepeer-review

    Abstract

    With the help of a simple model, we analyze Scanning Tunneling Microscopy images of simple and double moiré patterns resulting from misoriented bi- and tri-layers graphene stacks. It is found that the model reproduces surprisingly well non-trivial features observed in the Fast Fourier Transform of the images. We point out difficulties due to those features in interpreting the patterns seen on the FFT.

    Original languageEnglish
    Pages (from-to)48-52
    Number of pages5
    JournalCarbon
    Volume83
    Early online date20 Nov 2014
    DOIs
    Publication statusPublished - 1 Mar 2015

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