Abstract
With the help of a simple model, we analyze Scanning Tunneling Microscopy images of simple and double moiré patterns resulting from misoriented bi- and tri-layers graphene stacks. It is found that the model reproduces surprisingly well non-trivial features observed in the Fast Fourier Transform of the images. We point out difficulties due to those features in interpreting the patterns seen on the FFT.
Original language | English |
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Pages (from-to) | 48-52 |
Number of pages | 5 |
Journal | Carbon |
Volume | 83 |
Early online date | 20 Nov 2014 |
DOIs | |
Publication status | Published - 1 Mar 2015 |
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Dive into the research topics of 'Fourier transform analysis of STM images of multilayer graphene moiré patterns'. Together they form a unique fingerprint.Equipment
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Scanning Tunneling Microscopy
Sporken, R. (Manager)
Technological Platform Morphology - ImagingFacility/equipment: Equipment
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Synthesis, Irradiation and Analysis of Materials (SIAM)
Louette, P. (Manager), Colaux, J. (Manager), Felten, A. (Manager), Tabarrant, T. (Operator), COME, F. (Operator) & Debarsy, P.-L. (Manager)
Technological Platform Synthesis, Irradiation and Analysis of MaterialsFacility/equipment: Technological Platform