Analysis of semiconductors and insulators by high resolution electron energy loss spectroscopy - prospects for quantification

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langue originale	Anglais
Pages (de - à)	189-205
Nombre de pages	17
journal	Surface and interface analysis
Volume	15
Etat de la publication	Publié - 1990

Contient cette citation

@article{4c37fce372594243bdd47bf0d9797e49,

title = "Analysis of semiconductors and insulators by high resolution electron energy loss spectroscopy - prospects for quantification",

author = "Jean-Jacques Pireaux and Paul Thiry and Robert Sporken and Roland Caudano",

year = "1990",

language = "English",

volume = "15",

pages = "189--205",

journal = "Surface and interface analysis",

publisher = "John Wiley and Sons Ltd",

}