Analysis of semiconductors and insulators by high resolution electron energy loss spectroscopy - prospects for quantification

Research output: Contribution to journal › Article

Original language	English
Pages (from-to)	189-205
Number of pages	17
Journal	Surface and interface analysis
Volume	15
Publication status	Published - 1990

Cite this

@article{4c37fce372594243bdd47bf0d9797e49,

title = "Analysis of semiconductors and insulators by high resolution electron energy loss spectroscopy - prospects for quantification",

author = "Jean-Jacques Pireaux and Paul Thiry and Robert Sporken and Roland Caudano",

year = "1990",

language = "English",

volume = "15",

pages = "189--205",

journal = "Surface and interface analysis",

publisher = "John Wiley and Sons Ltd",

}