Glass and silicon probes: A comparative theoretical study for near-field optical microscopy

A. Castiaux, H. U. Danzebrink, X. Bouju

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Résumé

Glass fibers, chemically etched at their extremities and covered with a thin metal coating, are often present in near-field optical microscopy. Such elongated systems can be used to either probe the evanescent components of the electromagnetic field at the surface of a sample, or locally couple this sample with optical evanescent waves. In this article, we analyze theoretically an alternative tip design made with a silicon core. This kind of probe could be very useful when infrared properties of a surface are to be investigated. The advantages of using such a material for near-field optical detection will be stressed and compared with the performances of a bulk glass fiber.

langue originaleAnglais
Pages (de - à)52-57
Nombre de pages6
journalJournal of Applied Physics
Volume84
Numéro de publication1
Les DOIs
Etat de la publicationPublié - 1 juil. 1998

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