Glass and silicon probes: A comparative theoretical study for near-field optical microscopy

A. Castiaux, H. U. Danzebrink, X. Bouju

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Abstract

Glass fibers, chemically etched at their extremities and covered with a thin metal coating, are often present in near-field optical microscopy. Such elongated systems can be used to either probe the evanescent components of the electromagnetic field at the surface of a sample, or locally couple this sample with optical evanescent waves. In this article, we analyze theoretically an alternative tip design made with a silicon core. This kind of probe could be very useful when infrared properties of a surface are to be investigated. The advantages of using such a material for near-field optical detection will be stressed and compared with the performances of a bulk glass fiber.

Original languageEnglish
Pages (from-to)52-57
Number of pages6
JournalJournal of Applied Physics
Volume84
Issue number1
DOIs
Publication statusPublished - 1 Jul 1998

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