Diode Laser Measurements of Line Strengths and Collisional Halfwidths in the ν1 Band of OCS at 298 and 200K

Diode Laser Measurements of Line Strengths and Collisional Halfwidths in the ν₁ Band of OCS at 298 and 200K

Jean-Pierre Bouanich, Ghislain Blanquet, Jacques Walrand, Charles Courtoy

Résultats de recherche: Contribution à un journal/une revue › Article › Revue par des pairs

langue originale	Anglais
Pages (de - à)	295-306
Nombre de pages	12
journal	Journal of Quantitative Spectroscopy and Radiative Tranfert
Volume	36
Etat de la publication	Publié - 1986

@article{1d842aac64fe40eabb850fc5bb1d3f15,

title = "Diode Laser Measurements of Line Strengths and Collisional Halfwidths in the ν1 Band of OCS at 298 and 200K",

author = "Jean-Pierre Bouanich and Ghislain Blanquet and Jacques Walrand and Charles Courtoy",

year = "1986",

language = "English",

volume = "36",

pages = "295--306",

journal = "Journal of Quantitative Spectroscopy and Radiative Tranfert",

}

TY - JOUR

T1 - Diode Laser Measurements of Line Strengths and Collisional Halfwidths in the ν1 Band of OCS at 298 and 200K

AU - Bouanich, Jean-Pierre

AU - Blanquet, Ghislain

AU - Walrand, Jacques

AU - Courtoy, Charles

PY - 1986

Y1 - 1986

M3 - Article

VL - 36

SP - 295

EP - 306

JO - Journal of Quantitative Spectroscopy and Radiative Tranfert

JF - Journal of Quantitative Spectroscopy and Radiative Tranfert

ER -