Original language | English |
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Pages (from-to) | 295-306 |
Number of pages | 12 |
Journal | Journal of Quantitative Spectroscopy and Radiative Tranfert |
Volume | 36 |
Publication status | Published - 1986 |
Diode Laser Measurements of Line Strengths and Collisional Halfwidths in the ν1 Band of OCS at 298 and 200K
Jean-Pierre Bouanich, Ghislain Blanquet, Jacques Walrand, Charles Courtoy
Research output: Contribution to journal › Article › peer-review