Co Interaction on ZnO (000-1) investigated by scanning probe microscopies and LEED, C. Moisson, D. Turover

Sébastien Couet; Thomas Seldrum; Robert Sporken; Jacques Dumont

doi:10.1007/s00339-007-3972-2

Co Interaction on ZnO (000-1) investigated by scanning probe microscopies and LEED, C. Moisson, D. Turover

Sébastien Couet, Thomas Seldrum, Robert Sporken, Jacques Dumont

Résultats de recherche: Contribution à un journal/une revue › Article

Résumé

The interaction of Co thin films on atomically flat ZnO(000–1) has been investigated by low energy electron diffraction (LEED), scanning tunneling microscopy (STM) and Auger electron spectroscopy (AES). A high density of islands nucleates at the earliest stages of the growth and a subsequent Wolmer–Weber growth of these islands is observed. Upon annealing at 600 °C, an atomically flat surface (Zn,Co)O(000–1) is restored due to the diffusion of the Co into the semiconductor.

langue originale	Anglais
Pages (de - à)	111-117
Nombre de pages	7
journal	Applied Physics A
Volume	88
Les DOIs	https://doi.org/10.1007/s00339-007-3972-2
Etat de la publication	Publié - 2007

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@article{7150663d13824577ba1902ee038c57da,

title = "Co Interaction on ZnO (000-1) investigated by scanning probe microscopies and LEED, C. Moisson, D. Turover",

abstract = "The interaction of Co thin films on atomically flat ZnO(000–1) has been investigated by low energy electron diffraction (LEED), scanning tunneling microscopy (STM) and Auger electron spectroscopy (AES). A high density of islands nucleates at the earliest stages of the growth and a subsequent Wolmer–Weber growth of these islands is observed. Upon annealing at 600 °C, an atomically flat surface (Zn,Co)O(000–1) is restored due to the diffusion of the Co into the semiconductor. ",

author = "S{\'e}bastien Couet and Thomas Seldrum and Robert Sporken and Jacques Dumont",

year = "2007",

doi = "10.1007/s00339-007-3972-2",

language = "English",

volume = "88",

pages = "111--117",

journal = "Applied Physics A",

issn = "0947-8396",

publisher = "Springer Heidelberg",

}

TY - JOUR

T1 - Co Interaction on ZnO (000-1) investigated by scanning probe microscopies and LEED, C. Moisson, D. Turover

AU - Couet, Sébastien

AU - Seldrum, Thomas

AU - Sporken, Robert

AU - Dumont, Jacques

PY - 2007

Y1 - 2007

N2 - The interaction of Co thin films on atomically flat ZnO(000–1) has been investigated by low energy electron diffraction (LEED), scanning tunneling microscopy (STM) and Auger electron spectroscopy (AES). A high density of islands nucleates at the earliest stages of the growth and a subsequent Wolmer–Weber growth of these islands is observed. Upon annealing at 600 °C, an atomically flat surface (Zn,Co)O(000–1) is restored due to the diffusion of the Co into the semiconductor.

AB - The interaction of Co thin films on atomically flat ZnO(000–1) has been investigated by low energy electron diffraction (LEED), scanning tunneling microscopy (STM) and Auger electron spectroscopy (AES). A high density of islands nucleates at the earliest stages of the growth and a subsequent Wolmer–Weber growth of these islands is observed. Upon annealing at 600 °C, an atomically flat surface (Zn,Co)O(000–1) is restored due to the diffusion of the Co into the semiconductor.

U2 - 10.1007/s00339-007-3972-2

DO - 10.1007/s00339-007-3972-2

M3 - Article

SN - 0947-8396

VL - 88

SP - 111

EP - 117

JO - Applied Physics A

JF - Applied Physics A

ER -

Co Interaction on ZnO (000-1) investigated by scanning probe microscopies and LEED, C. Moisson, D. Turover

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