XPS evidence for negative ion formation in SIMS depth profiling of organic material with cesium

Nimer Wehbe, Jean Jacques Pireaux, Laurent Houssiau

Research output: Contribution to journal › Article › peer-review

1 results
- Title(descending)

Synthesis, Irradiation and Analysis of Materials (SIAM)
Pierre Louette (Manager), Julien Colaux (Manager), Alexandre Felten (Manager), Tijani Tabarrant (Operator), Frederic COME (Operator) & Paul-Louis Debarsy (Manager)
Technological Platform Synthesis, Irradiation and Analysis of Materials
Facility/equipment: Technological Platform