Abstract
Far-field terahertz imaging is limited by diffraction to low resolutions in the 50 μm range. On the other hand, near-field optical nanoscopy is a recent technique that shows permittivity contrasts at the nanoscale. We present here images of graphene layers on SiO2 obtained by scattering scanning near-field nanoscopy at 2.5 THz that show high contrasts.
Original language | English |
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Title of host publication | IRMMW-THz 2015 - 40th International Conference on Infrared, Millimeter, and Terahertz Waves |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9781479982721 |
DOIs | |
Publication status | Published - 11 Nov 2015 |
Externally published | Yes |
Event | 40th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2015 - Hong Kong, China Duration: 23 Aug 2015 → 28 Aug 2015 |
Conference
Conference | 40th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2015 |
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Country/Territory | China |
City | Hong Kong |
Period | 23/08/15 → 28/08/15 |