Résumé
Far-field terahertz imaging is limited by diffraction to low resolutions in the 50 μm range. On the other hand, near-field optical nanoscopy is a recent technique that shows permittivity contrasts at the nanoscale. We present here images of graphene layers on SiO2 obtained by scattering scanning near-field nanoscopy at 2.5 THz that show high contrasts.
langue originale | Anglais |
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titre | IRMMW-THz 2015 - 40th International Conference on Infrared, Millimeter, and Terahertz Waves |
Editeur | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronique) | 9781479982721 |
Les DOIs | |
Etat de la publication | Publié - 11 nov. 2015 |
Modification externe | Oui |
Evénement | 40th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2015 - Hong Kong, Chine Durée: 23 août 2015 → 28 août 2015 |
Une conférence
Une conférence | 40th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2015 |
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Pays/Territoire | Chine |
La ville | Hong Kong |
période | 23/08/15 → 28/08/15 |