Abstract
XPS measurements of poly(ethylene terephthalate) recorded with a SSX-100 spectrometer in standardized experimental conditions are presented : survey scan, high resolution core level spectra as well as the energy loss regions of carbon and oxygen peaks are presented.
| Original language | English |
|---|---|
| Pages (from-to) | 1-5 |
| Number of pages | 5 |
| Journal | Surface science spectra |
| Volume | 12 |
| Publication status | Published - 2005 |
Keywords
- surface
- polymer
- x-ray
- terephthalate
- loss
- spectroscopy
- photoelectron
- energy
- XPS
- PET
- ethylene
- core level
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Synthesis, Irradiation and Analysis of Materials (SIAM)
Louette, P. (Manager), Colaux, J. (Manager), Felten, A. (Manager), Tabarrant, T. (Operator), COME, F. (Operator) & Debarsy, P.-L. (Manager)
Technological Platform Synthesis, Irradiation and Analysis of MaterialsFacility/equipment: Technological Platform