XPS measurements of poly(ethylene oxide) (PEO) recorded with a SSX-100 spectrometer in standardized experimental conditions are presented: survey scan, high resolution core level spectra as well as the energy loss regions of the main elements are analyzed.
|Number of pages||5|
|Journal||Surface science spectra|
|Publication status||Unpublished - 2005|
- core level
- x-ray photoelectron
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Synthesis, Irradiation and Analysis of Materials (SIAM)
Pierre Louette (Manager), Julien Colaux (Manager), Alexandre Felten (Manager) & Jorge Humberto Mejia Mendoza (Manager)Technological Platform Synthesis, Irradiation and Analysis of Materials
Facility/equipment: Technological Platform