Polarization Dependence of the C 1s X-ray Absorption Spectra of Individual Multi-Walled Carbon Nanotubes

Ebrahim Najafi; Daniel Hernandez Cruz; Martin Obst; Adam Hitchcock; Bastien Douhard; Jean-Jacques Pireaux; Alexandre Felten

Polarization Dependence of the C 1s X-ray Absorption Spectra of Individual Multi-Walled Carbon Nanotubes

Ebrahim Najafi, Daniel Hernandez Cruz, Martin Obst, Adam Hitchcock, Bastien Douhard, Jean-Jacques Pireaux, Alexandre Felten

Namur Research Institute for Life Sciences

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	2279-2285
Number of pages	7
Journal	Small
Volume	4
Publication status	Published - 2008

Synthesis, Irradiation and Analysis of Materials (SIAM)
Pierre Louette (Manager), Julien Colaux (Manager), Alexandre Felten (Manager), Tijani Tabarrant (Operator), Frederic COME (Operator) & Paul-Louis Debarsy (Manager)
Technological Platform Synthesis, Irradiation and Analysis of Materials
Facility/equipment: Technological Platform

Cite this

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title = "Polarization Dependence of the C 1s X-ray Absorption Spectra of Individual Multi-Walled Carbon Nanotubes",

author = "Ebrahim Najafi and {Hernandez Cruz}, Daniel and Martin Obst and Adam Hitchcock and Bastien Douhard and Jean-Jacques Pireaux and Alexandre Felten",

year = "2008",

language = "English",

volume = "4",

pages = "2279--2285",

journal = "Small",

issn = "1613-6829",

publisher = "Wiley-VCH Verlag",

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TY - JOUR

T1 - Polarization Dependence of the C 1s X-ray Absorption Spectra of Individual Multi-Walled Carbon Nanotubes

AU - Najafi, Ebrahim

AU - Hernandez Cruz, Daniel

AU - Obst, Martin

AU - Hitchcock, Adam

AU - Douhard, Bastien

AU - Pireaux, Jean-Jacques

AU - Felten, Alexandre

PY - 2008

Y1 - 2008

M3 - Article

SN - 1613-6829

VL - 4

SP - 2279

EP - 2285

JO - Small

JF - Small

ER -

Polarization Dependence of the C 1s X-ray Absorption Spectra of Individual Multi-Walled Carbon Nanotubes

Equipment

Synthesis, Irradiation and Analysis of Materials (SIAM)

Cite this