We have studied the apatite growth dynamics on tantalum oxide surfaces. This nucleation is obtained via an organosilane intermediate layer between the apatite and the substrate surface. Four organosilane layers (differing by their terminal functionality) were investigated. Their characterization with atomic force microscopy and other techniques such as X-ray photoelectron spectroscopy (XPS) and wetting measurements highlighted the influence of the organosilane terminal groups on the apatite growth rates. Results revealed that apatite is indeed growing faster on phosphate terminal groups than on the three other groups studied (vinyl, hydroxyl and carboxyl). © 2008 Elsevier B.V. All rights reserved.
|Number of pages||8|
|Journal||Applied Surface Science|
|Publication status||Published - 15 Feb 2009|
- Self-Assembled Monolayers
- Atomic Force Microscopy
- X-ray Photoelectron Spectroscopy
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Synthesis, Irradiation and Analysis of Materials (SIAM)
Pierre Louette (Manager), Julien Colaux (Manager), Alexandre Felten (Manager) & Jorge Humberto Mejia Mendoza (Manager)Technological Platform Synthesis, Irradiation and Analysis of Materials
Facility/equipment: Technological Platform