Depth Profiling of Organic Light-Emitting Diodes by ToF-SIMS Coupled with Wavelet–Principal Component Analysis

Céline Noël, Nunzio Tuccitto, Yan Busby, Manuel Auer-Berger, Antonino Licciardello, Emil J.W. List-Kratochvil, Laurent Houssiau

Research output: Contribution to journal › Article › peer-review

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- Title(descending)

Synthesis, Irradiation and Analysis of Materials (SIAM)
Pierre Louette (Manager), Julien Colaux (Manager), Alexandre Felten (Manager), Tijani Tabarrant (Operator), Frederic COME (Operator) & Paul-Louis Debarsy (Manager)
Technological Platform Synthesis, Irradiation and Analysis of Materials
Facility/equipment: Technological Platform