Deposition of CeO2 on Si(111) studied by LEED, AES, XPS and RBS

C.E. Guillaume, M. Vermeersch, Robert Sporken, J.J. Verbist, S. Mathot, Guy Demortier

Research output: Contribution to journal › Article › peer-review

Original language	English
Journal	Surface and interface analysis
Volume	22
Publication status	Published - 1994

Cite this

@article{87e3fb691c77463b825b0777b68994fe,

title = "Deposition of CeO2 on Si(111) studied by LEED, AES, XPS and RBS",

author = "C.E. Guillaume and M. Vermeersch and Robert Sporken and J.J. Verbist and S. Mathot and Guy Demortier",

year = "1994",

language = "English",

volume = "22",

journal = "Surface and interface analysis",

issn = "0142-2421",

publisher = "John Wiley and Sons Ltd",

}