Correlation between surface topography, optical band gaps and crystalline properties of engineered AZO and CAZO thin films

Laya Dejam, Shahram Solaymani, Amine Achour, Sebastian Stach, Ştefan Ţălu, Negin Beryani Nezafat, Vali Dalouji, Ali Asghar Shokri, Atefeh Ghaderi

Research output: Contribution to journalArticle

Abstract

In this work, the stereometric 3-D surface topography as well as the optical properties of the Al doped ZnO (AZO), and Al/Cu co-doped ZnO (CAZO) thin films were investigated. These films were deposited with different thicknesses of 50 and 150 nm. The effect of dopants (Al, Cu) and sputtering parameters on the microstructures, crystalline structures, and fractal features were probed by Atomic Force Microscopy (AFM), X-ray diffraction, and Rutherford back scattering. AFM analysis of 3-D surface texture provided a deeper insight into their characteristics and implementation in graphical models and computer simulation. Studying surface roughness of samples at nanometer scale revealed a fractal structure which confirmed the relationship between the value of the fractal dimension and surface roughness parameters. Moreover, the optical properties of AZO and CAZO thin films and the relationship between their optical band gaps and their varied thicknesses were evaluated by Ultraviolet–visible spectrophotometry.

Original languageEnglish
Pages (from-to)78-90
Number of pages13
JournalChemical Physics Letters
Volume719
DOIs
Publication statusPublished - 16 Mar 2019

Fingerprint

Optical band gaps
Surface topography
Fractals
Atomic force microscopy
fractals
topography
Optical properties
Surface roughness
Crystalline materials
Thin films
Spectrophotometry
surface roughness
Fractal dimension
thin films
atomic force microscopy
Sputtering
optical properties
Textures
Doping (additives)
Scattering

Keywords

  • AZO and CAZO thin films
  • DC-magnetron sputtering
  • Stereometric analysis
  • Three-dimensional surface micromorphology

Cite this

Dejam, Laya ; Solaymani, Shahram ; Achour, Amine ; Stach, Sebastian ; Ţălu, Ştefan ; Nezafat, Negin Beryani ; Dalouji, Vali ; Shokri, Ali Asghar ; Ghaderi, Atefeh. / Correlation between surface topography, optical band gaps and crystalline properties of engineered AZO and CAZO thin films. In: Chemical Physics Letters. 2019 ; Vol. 719. pp. 78-90.
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Correlation between surface topography, optical band gaps and crystalline properties of engineered AZO and CAZO thin films. / Dejam, Laya; Solaymani, Shahram; Achour, Amine; Stach, Sebastian; Ţălu, Ştefan; Nezafat, Negin Beryani; Dalouji, Vali; Shokri, Ali Asghar; Ghaderi, Atefeh.

In: Chemical Physics Letters, Vol. 719, 16.03.2019, p. 78-90.

Research output: Contribution to journalArticle

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