Correlation between surface topography, optical band gaps and crystalline properties of engineered AZO and CAZO thin films

Laya Dejam, Shahram Solaymani, Amine Achour, Sebastian Stach, Ştefan Ţălu, Negin Beryani Nezafat, Vali Dalouji, Ali Asghar Shokri, Atefeh Ghaderi

    Résultats de recherche: Contribution à un journal/une revueArticle

    Résumé

    In this work, the stereometric 3-D surface topography as well as the optical properties of the Al doped ZnO (AZO), and Al/Cu co-doped ZnO (CAZO) thin films were investigated. These films were deposited with different thicknesses of 50 and 150 nm. The effect of dopants (Al, Cu) and sputtering parameters on the microstructures, crystalline structures, and fractal features were probed by Atomic Force Microscopy (AFM), X-ray diffraction, and Rutherford back scattering. AFM analysis of 3-D surface texture provided a deeper insight into their characteristics and implementation in graphical models and computer simulation. Studying surface roughness of samples at nanometer scale revealed a fractal structure which confirmed the relationship between the value of the fractal dimension and surface roughness parameters. Moreover, the optical properties of AZO and CAZO thin films and the relationship between their optical band gaps and their varied thicknesses were evaluated by Ultraviolet–visible spectrophotometry.

    langue originaleAnglais
    Pages (de - à)78-90
    Nombre de pages13
    journalChemical Physics Letters
    Volume719
    Les DOIs
    Etat de la publicationPublié - 16 mars 2019

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