Depth profiling of organic layers by low energy ions

Project: PHD

Project Details


This project consist in a use of ToF-SIMS for the developement of a depth-profiling technic in the rising field of thin layers and multi-layers of polymers(OLED,organic electronic,...). The ToF-SIMS technic is destructive by essence but we propose to erode organic materials with reactive primary ions and a very low energy (
Effective start/end date1/09/06 → …


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