Project Details
Description
This project consist in a use of ToF-SIMS for the developement of a depth-profiling technic in the rising field of thin layers and multi-layers of polymers(OLED,organic electronic,...). The ToF-SIMS technic is destructive by essence but we propose to erode organic materials with reactive primary ions and a very low energy (
| Status | Active |
|---|---|
| Effective start/end date | 1/09/06 → … |
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Equipment
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Synthesis, Irradiation and Analysis of Materials (SIAM)
Pierre Louette (Manager), Julien Colaux (Manager), Alexandre Felten (Manager) & Jorge Humberto Mejia Mendoza (Manager)
Technological Platform Synthesis, Irradiation and Analysis of MaterialsFacility/equipment: Technological Platform