Project Details
Description
This project consist in a use of ToF-SIMS for the developement of a depth-profiling technic in the rising field of thin layers and multi-layers of polymers(OLED,organic electronic,...). The ToF-SIMS technic is destructive by essence but we propose to erode organic materials with reactive primary ions and a very low energy (
| Status | Active |
|---|---|
| Effective start/end date | 1/09/06 → … |
Fingerprint
Explore the research topics touched on by this project. These labels are generated based on the underlying awards/grants. Together they form a unique fingerprint.
Equipment
-
Synthesis, Irradiation and Analysis of Materials (SIAM)
Louette, P. (Manager), Colaux, J. (Manager), Felten, A. (Manager), Tabarrant, T. (Operator), COME, F. (Operator) & Debarsy, P.-L. (Manager)
Technological Platform Synthesis, Irradiation and Analysis of MaterialsFacility/equipment: Technological Platform