The 16th International Conference on Secondary Ion Mass Spectrometry , Kanazawa, Japan.

Wehbe, N. (Poster)

Activity: Participating in or organising an event typesParticipation in conference

Description

"Metal-Assisted SIMS and Cluster Ion Bombardment for Ion Yield Enhancement". A. Heile, N. Wehbe, A. Delcorte, P. Bertrand, A. Felten, L. Houssiau, J.-J. Pireau, R. De Mondt, L. Van Vaeck, D. Lipinsky and H. F. Arlinghaus.
Period29 Oct 2007 - 2 Nov 2007
Event typeConference
LocationKanazawa, Japan.