The 16th International Conference on Secondary Ion Mass Spectrometry , Kanazawa, Japan.

Nimer Wehbe (Poster)

University of Namur

Activity: Participating in or organising an event types › Participation in conference

Description

"Metal-Assisted SIMS and Cluster Ion Bombardment for Ion Yield Enhancement". A. Heile, N. Wehbe, A. Delcorte, P. Bertrand, A. Felten, L. Houssiau, J.-J. Pireau, R. De Mondt, L. Van Vaeck, D. Lipinsky and H. F. Arlinghaus.

Period	29 Oct 2007 → 2 Nov 2007
Event type	Conference
Location	Kanazawa, Japan.Show on map