SIMS XIX

Houssiau, L. (Speaker)

Activity: Participating in or organising an event typesParticipation in conference

Description

2 conferences : "Investigation of Cs surface layer formation in Cs-SIMS with TOF-MEIS and SIMS" "Depth Resolution Optimization in Dual Beam Cs+/Bi3+ Depth Profiling of Amino Acids Multilayers"
Period29 Sep 20134 Oct 2013
Event typeScientific committee
LocationJeju, Korea, Republic of