SIMS International XIV

  • Jérémy Brison (Contributor)

Activity: Participating in or organising an event types › Participation in conference

Description

Cesium/Xenon dual beam depth profiling with ToF-SIMS: measurement and modeling of M+, MCs+, and M2Cs2+ yields, communic
Period28 Apr 2008
Event typeConference
LocationSan Diego CA, Etats-UnisShow on map