Fourth International Conference on Microelectronics and Interfaces (ICMI'03)

Houssiau, L. (Contributor)

University of Namur

Activity: Participating in or organising an event types › Participation in conference

Description

Multitechnique Characterisation of Al₂O₃ Thin Layers Deposited on SiO₂/Si surface by Atomic Layer Chemical Vapour Deposition, communivation orale. Co-au

Period	3 Mar 2003 → 6 Mar 2003
Event type	Conference
Location	Santa Clara CA, Etats-UnisShow on map