31st International Conference of the Physics and Chemistry of Semiconductor Interfaces (IPCSI-31)

Activity: Participating in or organising an event typesParticipation in conference


Oral presentation : <Interfacial chemistry at high-k oxide layers on pretreated silicon wafers : XPS and TOF-SIMS study > ; R. Vitchev, T. Conard, H. Bender, L. Houssiau, J.J. Pireaux
Period18 Jan 200422 Jan 2004
Event typeConference
LocationKona, HI-USAShow on map