14th International Conference on Secondary Ion Mass Spectrometry (SIMS XIV)

Jérémy Brison (Contributor)

University of Namur

Activity: Participating in or organising an event types › Participation in conference

Description

Cesium/xenon dual beam depth profiling: A new approach for semi-quantitative depth profiles with ToF-SIMS, communication orale. Co-auteurs : T. Conard, W. Vandervorst et L. Houssiau.

Period	14 Sept 2003 → 19 Sept 2003
Event type	Conference
Location	San Diego CA, Etats-UnisShow on map