Ion beam analysis of Cs-implanted zirconia and spinel

A. Gentils, SE. Enescu, H. Khodja, Tristan Thome

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    Résumé

    Fission products (Cs) were introduced into yttria-stabilized zirconia (YSZ) and magnesium aluminate spinel (MAS) single crystals by room temperature ion implantation. The effect of high-temperature annealing on the depth distribution of implanted species and the surface homogeneity of crystals were investigated by the combination of AFM and RBS using a macro- and a micro-ion beam. The diffusion and release of Cs involve mechanisms which depend on the material and Cs concentration. In YSZ Cs desorbs out of the crystal at lower temperature (∼550 °C) than in MAS (∼850 °C). In YSZ the surface of the sample remains unaltered when Cs desorption occurs, whereas in MAS Cs desorption is accompanied by the exfoliation of the sample surface.
    langue originaleAnglais
    Pages (de - à)326-329
    Nombre de pages4
    journalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
    Volume249
    Numéro de publication1-2
    Les DOIs
    Etat de la publicationPublié - 2006

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