XPS and SEM evaluation of six Chemical and Physiclal Techniques for cleaning of contaminated titanium implants

J. Mouhyi, L. Sennerby, Pierre Louette, Jean-Jacques Pireaux, N. Dourov, S. Nammour, J. van Reck

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)185-194
Number of pages10
JournalClin. Oral Impl. Res.
Publication statusPublished - 1998

Cite this