TOF-SIMS Depth profiling of vitamin C layers using Cs+ and Xe+ ion beams

Engineering & Materials Science

• Depth profiling 100%
• Vitamins 91%
• Secondary ion mass spectrometry 91%
• Cesium 86%
• Xenon 82%
• Ascorbic acid 17%
• Sputtering 12%
• Silicon wafers 12%
• Molecules 9%

Physics & Astronomy

• ascorbic acid 95%
• cesium 64%
• secondary ion mass spectrometry 62%
• xenon 61%
• ion beams 47%
• molecular ions 22%
• fragments 17%
• profiles 11%
• methylidyne 10%
• reactivity 10%
• energy 8%
• fluence 8%
• sputtering 7%
• wafers 7%
• silicon 5%
• molecules 5%
• ions 4%

Chemical Compounds

• Depth Profiling 76%
• Time-of-Flight Secondary Ion Mass Spectrometry 73%
• Vitamin C 73%
• Ion Beam 67%
• Molecular Ion 21%
• Energy 14%
• Sputtering 10%
• Ascorbic Acid 9%
• Reaction Yield 4%
• Ion 4%
• Molecule 3%