Project Details
Description
High resolution electron energy loss, inverse and direct photoemission spectroscopies are used in a complementary manner to characterize surfaces of aluminum nitride and silicon carbide.
| Status | Finished |
|---|---|
| Effective start/end date | 1/01/98 → 31/12/99 |
Keywords
- AlN
- SiC
- solid state
- surfaces
- photoemission
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