INIS
nitrogen
100%
germanium
70%
depth
60%
silicon
58%
diffusion
57%
ion implantation
56%
energy
51%
nitrogen 15
45%
sputtering
40%
nanocrystals
38%
coatings
37%
doses
37%
annealing
36%
films
36%
transmission electron microscopy
35%
silica
35%
layers
34%
carbon
34%
copper
33%
carbon 12
30%
carbon nitrides
30%
surfaces
28%
kev range
26%
atoms
26%
silicon oxides
24%
aluminium
23%
aluminium nitrides
23%
cross sections
22%
aluminum
22%
oxygen
22%
stainless steels
22%
nucleation
21%
concentration
21%
distribution
20%
nuclear reactions
20%
matrices
20%
ions
20%
electrons
18%
x-ray photoelectron spectroscopy
18%
yields
17%
conversion
16%
rutherford backscattering spectrometry
16%
comparative evaluations
16%
size
16%
germanium ions
16%
devices
15%
carbon 13
15%
high temperature
15%
chromium
15%
nuclear reaction analysis
14%
Material Science
Silicon
98%
Aluminum
93%
Germanium
79%
Nanocrystalline Material
78%
Silicon Dioxide
72%
Nitride Compound
62%
Ion Implantation
59%
Magnetron Sputtering
52%
Film
43%
Aluminum Nitride
42%
Thin Films
39%
Stainless Steel
39%
Titanium
39%
Annealing
37%
Transmission Electron Microscopy
34%
Oxynitride
33%
Carbon Nitride
33%
Density
32%
Secondary Ion Mass Spectrometry
28%
X-Ray Spectroscopy
27%
X-Ray Photoelectron Spectroscopy
27%
Thermal Diffusion
25%
Low Carbon Steel
23%
Scanning Electron Microscopy
23%
Carbon Nanotubes
22%
Chromium
22%
Chemical Bonding
22%
Desorption
22%
Nucleation
21%
Ion Beam Mixing
18%
Rutherford Backscattering Spectrometry
18%
Oxidation Reaction
16%
Water Vapor
15%
Germanium Ion
13%
Nanohardness
13%
Photoluminescence
13%
X-Ray Diffraction
11%
Luminescence
11%
Elemental Analysis
11%
Fretting
11%
Superconducting Material
11%
Molybdenum
11%
Tool Steel
11%
Cathode
11%
Diamond
11%
Mechanical Strength
11%
Inert Gas
11%
Stainless Steel 304L
11%
Positron Annihilation Spectroscopy
11%
Defect Structure
11%
Keyphrases
Implanted Silicon
22%
Germanium
22%
Radioactive Beams
22%
Implanted Targets
22%
Ge Nanocrystals
22%
Reactive Sputtering
22%
Reactive Gas
15%
Thermal Annealing
14%
Transmission Electron Microscopy
14%
Si Nanocrystals
14%
Radioactive Ion Beams
11%
Beam Energy
11%
Neutron Component
11%
Angular Range
11%
Elastic Scattering
11%
Transfer Process
11%
Ion Beam Facility
11%
Aluminum Foil
11%
Oxynitride Thin Film
11%
High-k Material
11%
Nitride Complexes
11%
Advanced Characterization
11%
Carbon Nitride
11%
C3N4
11%
304L Stainless Steel
11%
Water Vapor
11%
Titanium Oxynitride
11%
Beam Current
11%
Isotopic Nitrogen
11%
Electrostatic Accelerator
11%
Nuclear Analysis
11%
Low Noise
11%
Calibration Method
11%
Heavy Ion Irradiation
11%
Voltage Calibration
11%
Reverse Kinematics
11%
Nuclear Astrophysics
11%
Pure Hydrogen
11%
Transcranial Alternating Current Stimulation (tACS)
11%
Particle Scattering
11%
Surface Oxygen
11%
Systematic Error
11%
Cross Section Library
11%
Oxygen Isotope Analysis
11%
Ta2O5
11%
Ionic Movement
11%
Differential Cross Section
11%
Energy Calibration
11%
Nuclear Shell Model
11%
Stable Energy
11%