ZnSe/ZnSxSe1-x heterojunction valence band discontinuity measured by X-ray photoelectron spectroscopy

ZnSe/ZnS_xSe_1-x heterojunction valence band discontinuity measured by X-ray photoelectron spectroscopy

Robert Sporken, Khaled Abuel-Rub, Yuanping Chen, Siva Sivananthan

Résultats de recherche: Contribution à un journal/une revue › Article

langue originale	Anglais
Pages (de - à)	776-781
Nombre de pages	6
journal	Journal of Electronic Materials
Volume	27
Numéro de publication	6
Etat de la publication	Publié - 1998

@article{f270b0a61576439c94f504f5ab75e2e1,

title = "ZnSe/ZnSxSe1-x heterojunction valence band discontinuity measured by X-ray photoelectron spectroscopy",

author = "Robert Sporken and Khaled Abuel-Rub and Yuanping Chen and Siva Sivananthan",

note = "Publication code : **RES. ACAD.",

year = "1998",

language = "English",

volume = "27",

pages = "776--781",

journal = "Journal of Electronic Materials",

publisher = "Springer New York",

number = "6",

}

TY - JOUR

T1 - ZnSe/ZnSxSe1-x heterojunction valence band discontinuity measured by X-ray photoelectron spectroscopy

AU - Sporken, Robert

AU - Abuel-Rub, Khaled

AU - Chen, Yuanping

AU - Sivananthan, Siva

N1 - Publication code : **RES. ACAD.

PY - 1998

Y1 - 1998

M3 - Article

VL - 27

SP - 776

EP - 781

JO - Journal of Electronic Materials

JF - Journal of Electronic Materials

IS - 6

ER -