XPS study of polymer chain conformation in amorphous and crystalline poly(ethyleneterephthalate) samples: is the sensitivity limit reached

Résultats de recherche: Contribution à un journal/une revue › Article

Contient cette citation

@article{2118c9fcceb84b768b1890e1c817c44a,

title = "XPS study of polymer chain conformation in amorphous and crystalline poly(ethyleneterephthalate) samples: is the sensitivity limit reached",

author = "Pierre Boulanger and Jean-Jacques Pireaux and Jacques Verbist and Joseph Delhalle",

year = "1993",

language = "English",

volume = "63",

pages = "53--73",

journal = "J. Electron Spectroscopy",

}

TY - JOUR

T1 - XPS study of polymer chain conformation in amorphous and crystalline poly(ethyleneterephthalate) samples: is the sensitivity limit reached

AU - Boulanger, Pierre

AU - Pireaux, Jean-Jacques

AU - Verbist, Jacques

AU - Delhalle, Joseph

PY - 1993

Y1 - 1993

M3 - Article

VL - 63

SP - 53

EP - 73

JO - J. Electron Spectroscopy

JF - J. Electron Spectroscopy

ER -