XPS profiling of Biosensors Materials with a Argon Cluster Ions.

Jean-Jacques Pireaux, Pierre Louette, Laurent Houssiau, Nimer Wehbe, P. Mack, R.G. White, T.S. Nunney

Résultats de recherche: Contribution dans un livre/un catalogue/un rapport/dans les actes d'une conférenceChapitre (revu par des pairs)

langue originaleAnglais
titreProceedings of the AVS 59th International Symposium and Exhibition, Tampa , Florida, USA
étatPublié - 2012
EvénementAVS, 59th International Symposium and Exhibition - Tampa, FL., États-Unis
Durée: 28 oct. 20122 nov. 2012

Une conférence

Une conférenceAVS, 59th International Symposium and Exhibition
PaysÉtats-Unis
La villeTampa, FL.
période28/10/122/11/12

Citer ceci

Pireaux, J-J., Louette, P., Houssiau, L., Wehbe, N., Mack, P., White, R. G., & Nunney, T. S. (2012). XPS profiling of Biosensors Materials with a Argon Cluster Ions. Dans Proceedings of the AVS 59th International Symposium and Exhibition, Tampa , Florida, USA
Pireaux, Jean-Jacques ; Louette, Pierre ; Houssiau, Laurent ; Wehbe, Nimer ; Mack, P. ; White, R.G. ; Nunney, T.S. / XPS profiling of Biosensors Materials with a Argon Cluster Ions. Proceedings of the AVS 59th International Symposium and Exhibition, Tampa , Florida, USA. 2012.
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title = "XPS profiling of Biosensors Materials with a Argon Cluster Ions.",
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Pireaux, J-J, Louette, P, Houssiau, L, Wehbe, N, Mack, P, White, RG & Nunney, TS 2012, XPS profiling of Biosensors Materials with a Argon Cluster Ions. Dans Proceedings of the AVS 59th International Symposium and Exhibition, Tampa , Florida, USA. AVS, 59th International Symposium and Exhibition, Tampa, FL., États-Unis, 28/10/12.

XPS profiling of Biosensors Materials with a Argon Cluster Ions. / Pireaux, Jean-Jacques; Louette, Pierre; Houssiau, Laurent; Wehbe, Nimer; Mack, P. ; White, R.G. ; Nunney, T.S.

Proceedings of the AVS 59th International Symposium and Exhibition, Tampa , Florida, USA. 2012.

Résultats de recherche: Contribution dans un livre/un catalogue/un rapport/dans les actes d'une conférenceChapitre (revu par des pairs)

TY - CHAP

T1 - XPS profiling of Biosensors Materials with a Argon Cluster Ions.

AU - Pireaux, Jean-Jacques

AU - Louette, Pierre

AU - Houssiau, Laurent

AU - Wehbe, Nimer

AU - Mack, P.

AU - White, R.G.

AU - Nunney, T.S.

PY - 2012

Y1 - 2012

M3 - Chapter (peer-reviewed)

BT - Proceedings of the AVS 59th International Symposium and Exhibition, Tampa , Florida, USA

ER -

Pireaux J-J, Louette P, Houssiau L, Wehbe N, Mack P, White RG et al. XPS profiling of Biosensors Materials with a Argon Cluster Ions. Dans Proceedings of the AVS 59th International Symposium and Exhibition, Tampa , Florida, USA. 2012