X-ray photoemission spectroscopy and secondary-ion mass spectroscopy applied to the compositional study of pre-colonial pottery from Pantanal, Brazil

M.P. Felicissimo, J.L.S. Peixoto, R. Tomasi, A. Azioune, J.-J. Pireaux, L. Houssiau, U.P.R. Filho

Résultats de recherche: Contribution à un journal/une revueArticleRevue par des pairs

Résumé

X-ray photoemission spectroscopy (XPS) and time-of-flight (TOF) secondaryion mass spectroscopy (SIMS) have been applied to investigate potsherd samples from Pantanal, Brazil. One of the potsherds presented burnt bone as an additive, which was characterized by XPS as carbonate hydroxyapatite. For shell-tempered ceramics the phase present in shells after firing was identified by X-ray diffraction. TOF-SIMS was used to study the distribution of quartz as temper in one of the sherds. XPS was also applied to the characterization of the finishing external layer of the ceramic vessels. In this case, based on the Fe 2p spectra of the sherd's interior and outermost layers, it was possible to prove that their difference in coloration is due to black heart formation. Hierarchical clustering analysis and principal component analysis of the XPS elemental data enabled the potsherds to be classified with respect to their clay composition.
langue originaleAnglais
Pages (de - à)3483-3496
Nombre de pages14
journalPhilosophical Magazine
Volume84
Numéro de publication32
Les DOIs
Etat de la publicationPublié - 11 nov. 2004

Empreinte digitale Examiner les sujets de recherche de « X-ray photoemission spectroscopy and secondary-ion mass spectroscopy applied to the compositional study of pre-colonial pottery from Pantanal, Brazil ». Ensemble, ils forment une empreinte digitale unique.

Contient cette citation