Wide angular range operation of a dielectric multilayer film with a photonic-crystal-type defect

Résultats de recherche: Contribution à un journal/une revueLettre

Résumé

Light can tunnel through a high-reflectivity dielectric multilayer film when a photonic-crystal-type defect is introduced in the structure, which is useful for optical signal processing. We consider chirped structures with a defect in layer thickness for which high reflectivity is achieved over a broad wavelength range except within a narrow spectral window. The useful transmission window, while it shifts toward shorter wavelengths as the angle of incidence of the light beam is increased, does not, in general, survive; i.e., transmission disappears progressively. We show that wide angular range operation can, however, be achieved by a proper design of the chirped structure. Analytical expressions for the design parameters are derived on the basis of a semi-infinite photonic crystal model. Theoretical reflectance spectra of defect SiO2 /TiO2 chirped multilayer films are presented and discussed in terms of the dispersion of the electromagnetic radiation modes of the finite photonic crystal. These devices offer a simple way to mechanically tune (through inclination of the film) the wavelength transmitted from a fixed white-light beam.
langue originaleAnglais
Pages (de - à)686-688
Nombre de pages3
journalOptics Letters
Volume32
Numéro de publication6
étatPublié - 2007

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photonics
reflectance
light beams
defects
wavelengths
crystals
inclination
optical communication
tunnels
signal processing
electromagnetic radiation
incidence
shift

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title = "Wide angular range operation of a dielectric multilayer film with a photonic-crystal-type defect",
abstract = "Light can tunnel through a high-reflectivity dielectric multilayer film when a photonic-crystal-type defect is introduced in the structure, which is useful for optical signal processing. We consider chirped structures with a defect in layer thickness for which high reflectivity is achieved over a broad wavelength range except within a narrow spectral window. The useful transmission window, while it shifts toward shorter wavelengths as the angle of incidence of the light beam is increased, does not, in general, survive; i.e., transmission disappears progressively. We show that wide angular range operation can, however, be achieved by a proper design of the chirped structure. Analytical expressions for the design parameters are derived on the basis of a semi-infinite photonic crystal model. Theoretical reflectance spectra of defect SiO2 /TiO2 chirped multilayer films are presented and discussed in terms of the dispersion of the electromagnetic radiation modes of the finite photonic crystal. These devices offer a simple way to mechanically tune (through inclination of the film) the wavelength transmitted from a fixed white-light beam.",
keywords = "Optical devices : Multilayers Physical optics : Electromagnetic theory",
author = "Olivier Deparis and Cedric Vandenbem and Jean-Pol Vigneron",
year = "2007",
language = "English",
volume = "32",
pages = "686--688",
journal = "Optics Letters",
issn = "0146-9592",
publisher = "The Optical Society",
number = "6",

}

Wide angular range operation of a dielectric multilayer film with a photonic-crystal-type defect. / Deparis, Olivier; Vandenbem, Cedric; Vigneron, Jean-Pol.

Dans: Optics Letters, Vol 32, Numéro 6, 2007, p. 686-688.

Résultats de recherche: Contribution à un journal/une revueLettre

TY - JOUR

T1 - Wide angular range operation of a dielectric multilayer film with a photonic-crystal-type defect

AU - Deparis, Olivier

AU - Vandenbem, Cedric

AU - Vigneron, Jean-Pol

PY - 2007

Y1 - 2007

N2 - Light can tunnel through a high-reflectivity dielectric multilayer film when a photonic-crystal-type defect is introduced in the structure, which is useful for optical signal processing. We consider chirped structures with a defect in layer thickness for which high reflectivity is achieved over a broad wavelength range except within a narrow spectral window. The useful transmission window, while it shifts toward shorter wavelengths as the angle of incidence of the light beam is increased, does not, in general, survive; i.e., transmission disappears progressively. We show that wide angular range operation can, however, be achieved by a proper design of the chirped structure. Analytical expressions for the design parameters are derived on the basis of a semi-infinite photonic crystal model. Theoretical reflectance spectra of defect SiO2 /TiO2 chirped multilayer films are presented and discussed in terms of the dispersion of the electromagnetic radiation modes of the finite photonic crystal. These devices offer a simple way to mechanically tune (through inclination of the film) the wavelength transmitted from a fixed white-light beam.

AB - Light can tunnel through a high-reflectivity dielectric multilayer film when a photonic-crystal-type defect is introduced in the structure, which is useful for optical signal processing. We consider chirped structures with a defect in layer thickness for which high reflectivity is achieved over a broad wavelength range except within a narrow spectral window. The useful transmission window, while it shifts toward shorter wavelengths as the angle of incidence of the light beam is increased, does not, in general, survive; i.e., transmission disappears progressively. We show that wide angular range operation can, however, be achieved by a proper design of the chirped structure. Analytical expressions for the design parameters are derived on the basis of a semi-infinite photonic crystal model. Theoretical reflectance spectra of defect SiO2 /TiO2 chirped multilayer films are presented and discussed in terms of the dispersion of the electromagnetic radiation modes of the finite photonic crystal. These devices offer a simple way to mechanically tune (through inclination of the film) the wavelength transmitted from a fixed white-light beam.

KW - Optical devices : Multilayers Physical optics : Electromagnetic theory

M3 - Letter

VL - 32

SP - 686

EP - 688

JO - Optics Letters

JF - Optics Letters

SN - 0146-9592

IS - 6

ER -