Utilising Deep Learning Techniques for Effective Zero-Day Attack Detection

Hanan Hindy, Robert Atkinson, Christos Tachtatzis, Jean Noël Colin, Ethan Bayne, Xavier Bellekens

Résultats de recherche: Contribution à un journal/une revue › Article › Revue par des pairs

8 Téléchargements (Pure)

Accès au document

@article{c59cd243d4b6487c839ef2d9df7c16b7,

title = "Utilising Deep Learning Techniques for Effective Zero-Day Attack Detection",

author = "Hanan Hindy and Robert Atkinson and Christos Tachtatzis and Colin, {Jean No{\"e}l} and Ethan Bayne and Xavier Bellekens",

year = "2020",

language = "English",

volume = "9",

journal = "Electronics",

issn = "2079-9292",

publisher = "Multidisciplinary Digital Publishing Institute (MDPI)",

number = "10",

}

TY - JOUR

T1 - Utilising Deep Learning Techniques for Effective Zero-Day Attack Detection

AU - Hindy, Hanan

AU - Atkinson, Robert

AU - Tachtatzis, Christos

AU - Colin, Jean Noël

AU - Bayne, Ethan

AU - Bellekens, Xavier

PY - 2020

Y1 - 2020

UR - https://www.mdpi.com/2079-9292/9/10/1684/pdf

M3 - Article

VL - 9

JO - Electronics

JF - Electronics

SN - 2079-9292

IS - 10

ER -