Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications

J. Ratajczak, A. Laszcz, A. Czerwinski, J. Katcki, F. Phillipp, P. A. Van Aken, Nicolas Reckinger, E. Dubois

Résultats de recherche: Contribution dans un livre/un catalogue/un rapport/dans les actes d'une conférenceArticle dans les actes d'une conférence/un colloque

langue originaleAnglais
titre13th Conference on Electron Microscopy of Solids
étatPublié - 2009

Citer ceci

Ratajczak, J., Laszcz, A., Czerwinski, A., Katcki, J., Phillipp, F., Van Aken, P. A., ... Dubois, E. (2009). Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications. Dans 13th Conference on Electron Microscopy of Solids
Ratajczak, J. ; Laszcz, A. ; Czerwinski, A. ; Katcki, J. ; Phillipp, F. ; Van Aken, P. A. ; Reckinger, Nicolas ; Dubois, E. / Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications. 13th Conference on Electron Microscopy of Solids. 2009.
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title = "Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications",
author = "J. Ratajczak and A. Laszcz and A. Czerwinski and J. Katcki and F. Phillipp and {Van Aken}, {P. A.} and Nicolas Reckinger and E. Dubois",
year = "2009",
language = "English",
booktitle = "13th Conference on Electron Microscopy of Solids",

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Ratajczak, J, Laszcz, A, Czerwinski, A, Katcki, J, Phillipp, F, Van Aken, PA, Reckinger, N & Dubois, E 2009, Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications. Dans 13th Conference on Electron Microscopy of Solids.

Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications. / Ratajczak, J.; Laszcz, A.; Czerwinski, A.; Katcki, J.; Phillipp, F.; Van Aken, P. A.; Reckinger, Nicolas; Dubois, E.

13th Conference on Electron Microscopy of Solids. 2009.

Résultats de recherche: Contribution dans un livre/un catalogue/un rapport/dans les actes d'une conférenceArticle dans les actes d'une conférence/un colloque

TY - GEN

T1 - Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications

AU - Ratajczak, J.

AU - Laszcz, A.

AU - Czerwinski, A.

AU - Katcki, J.

AU - Phillipp, F.

AU - Van Aken, P. A.

AU - Reckinger, Nicolas

AU - Dubois, E.

PY - 2009

Y1 - 2009

M3 - Conference contribution

BT - 13th Conference on Electron Microscopy of Solids

ER -

Ratajczak J, Laszcz A, Czerwinski A, Katcki J, Phillipp F, Van Aken PA et al. Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications. Dans 13th Conference on Electron Microscopy of Solids. 2009