Towards Automated Test Case Generation Maturity

Urko Rueda, Fitsum Kifetew, Xavier Devroey

Résultats de recherche: Contribution dans un livre/un catalogue/un rapport/dans les actes d'une conférenceArticle dans les actes d'une conférence/un colloque

Résumé

This short paper reports our observations after six editions of the JUnitContest that benchmarks automated unit test generation tools for Java programs. We discuss our experience and depict the current state-of-the-art and identify potential future research directions. We advocate the use of benchmark as a standard practice to enhance maturity and foster adoption by the industry of automated test case generation tools.

langue originaleAnglais
titreProceedings - 2019 IEEE/ACM 12th International Workshop on Search-Based Software Testing, SBST 2019
EditeurInstitute of Electrical and Electronics Engineers Inc.
Pages9-10
Nombre de pages2
ISBN (Electronique)9781728122335
Les DOIs
étatPublié - 1 mai 2019
Modification externeOui
Evénement12th IEEE/ACM International Workshop on Search-Based Software Testing, SBST 2019 - Montreal, Canada
Durée: 27 mai 2019 → …

Série de publications

NomProceedings - 2019 IEEE/ACM 12th International Workshop on Search-Based Software Testing, SBST 2019

Une conférence

Une conférence12th IEEE/ACM International Workshop on Search-Based Software Testing, SBST 2019
PaysCanada
La villeMontreal
période27/05/19 → …

Empreinte digitale

Industry

Citer ceci

Rueda, U., Kifetew, F., & Devroey, X. (2019). Towards Automated Test Case Generation Maturity. Dans Proceedings - 2019 IEEE/ACM 12th International Workshop on Search-Based Software Testing, SBST 2019 (p. 9-10). [8812190] (Proceedings - 2019 IEEE/ACM 12th International Workshop on Search-Based Software Testing, SBST 2019). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SBST.2019.00011
Rueda, Urko ; Kifetew, Fitsum ; Devroey, Xavier. / Towards Automated Test Case Generation Maturity. Proceedings - 2019 IEEE/ACM 12th International Workshop on Search-Based Software Testing, SBST 2019. Institute of Electrical and Electronics Engineers Inc., 2019. p. 9-10 (Proceedings - 2019 IEEE/ACM 12th International Workshop on Search-Based Software Testing, SBST 2019).
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Rueda, U, Kifetew, F & Devroey, X 2019, Towards Automated Test Case Generation Maturity. Dans Proceedings - 2019 IEEE/ACM 12th International Workshop on Search-Based Software Testing, SBST 2019., 8812190, Proceedings - 2019 IEEE/ACM 12th International Workshop on Search-Based Software Testing, SBST 2019, Institute of Electrical and Electronics Engineers Inc., p. 9-10, 12th IEEE/ACM International Workshop on Search-Based Software Testing, SBST 2019, Montreal, Canada, 27/05/19. https://doi.org/10.1109/SBST.2019.00011

Towards Automated Test Case Generation Maturity. / Rueda, Urko; Kifetew, Fitsum; Devroey, Xavier.

Proceedings - 2019 IEEE/ACM 12th International Workshop on Search-Based Software Testing, SBST 2019. Institute of Electrical and Electronics Engineers Inc., 2019. p. 9-10 8812190 (Proceedings - 2019 IEEE/ACM 12th International Workshop on Search-Based Software Testing, SBST 2019).

Résultats de recherche: Contribution dans un livre/un catalogue/un rapport/dans les actes d'une conférenceArticle dans les actes d'une conférence/un colloque

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Rueda U, Kifetew F, Devroey X. Towards Automated Test Case Generation Maturity. Dans Proceedings - 2019 IEEE/ACM 12th International Workshop on Search-Based Software Testing, SBST 2019. Institute of Electrical and Electronics Engineers Inc. 2019. p. 9-10. 8812190. (Proceedings - 2019 IEEE/ACM 12th International Workshop on Search-Based Software Testing, SBST 2019). https://doi.org/10.1109/SBST.2019.00011